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===Statistical Multi-Scale Decomposition Modeling of Texture and Applications===
 
===Statistical Multi-Scale Decomposition Modeling of Texture and Applications===
Speaker: Prof. Mohand Said Allili, Assistant professor (University of Quebec/Canada): March 7, 2013
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Speaker: [http://w3.uqo.ca/allimo01/ Prof. Mohand Said Allili], Assistant professor (University of Quebec/Canada): March 7, 2013
    
Texture modeling and representation has been the subject of interest of several research works in the last decades. This presentation will focus on texture representation using multi-scale decompositions. More specifically, a new statistical framework, based on finite mixtures of Generalized Gaussian (MoGG) distributions, will be presented to model the distribution of multi-scale wavelet/contourlet decomposition coefficients of texture images. After a brief review of the state of the art about wavelet/contourlet statistical modeling, details about parameter estimation of the MoGG model will be presented. Then, two applications will be shown for the proposed approach, namely: wavelet/contourlet-based texture classification and retrieval, and fabric texture defect detection. Experimental results with comparison to recent state of the art methods will be presented as well.
 
Texture modeling and representation has been the subject of interest of several research works in the last decades. This presentation will focus on texture representation using multi-scale decompositions. More specifically, a new statistical framework, based on finite mixtures of Generalized Gaussian (MoGG) distributions, will be presented to model the distribution of multi-scale wavelet/contourlet decomposition coefficients of texture images. After a brief review of the state of the art about wavelet/contourlet statistical modeling, details about parameter estimation of the MoGG model will be presented. Then, two applications will be shown for the proposed approach, namely: wavelet/contourlet-based texture classification and retrieval, and fabric texture defect detection. Experimental results with comparison to recent state of the art methods will be presented as well.
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